%0 Conference Proceedings %T Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization %+ Équipe Matériaux et Procédés pour la Nanoélectronique (LAAS-MPN) %+ SCREEN-LASSE %+ Service Instrumentation Conception Caractérisation (LAAS-I2C) %+ Istituto per la Microelettronica e Microsistemi [Catania] (IMM) %+ Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI) %A Monflier, Richard %A Rizk, Hiba %A Tabata, Toshiyuki %A Roul, Julien %A Boninelli, Simona %A Italia, Markus %A Magna, Antonio, La %A Mazzamuto, Fulvio %A Acosta, Pablo %A Kerdilès, S %A Cristiano, Fuccio %A Bedel-Pereira, Eléna %< avec comité de lecture %Z Rapport LAAS n° 18188 %B 22nd International Conference on Ion Implantation Technology %C Würzburg, Germany %P 4 %8 2018-09-16 %D 2018 %R 10.1109/IIT.2018.8807933 %K melt laser annealing %K defects %K photoluminescence %Z Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsConference papers %X We present a comprehensive investigation of laser induced damage in silicon by implementing a methodology allowing the identification and the localization of the defects. PL analyses combined with TEM reveals that laser annealed samples reveal the presence of Carbon and Oxygen related defects, in the form of C-lines and G-lines (including the associated G satellite lines). Additional Oxygen related defects (Si-O-Si complexes) were revealed by FTIR analysis. Based on SIMS analyses combined with chemical etch, it is found that the optical defects observed in laser annealed samples originate from the oxygen atoms and carbon impurities contained in the surface native oxide from which they are released and subsequently diffuse into the substrate during anneal down to the liquid/solid interface. %G English %2 https://laas.hal.science/hal-01803955v2/document %2 https://laas.hal.science/hal-01803955v2/file/2018_IIT_Monflier_article_final.pdf %L hal-01803955 %U https://laas.hal.science/hal-01803955 %~ CEA %~ UNIV-TLSE2 %~ UNIV-TLSE3 %~ CNRS %~ INSA-TOULOUSE %~ LAAS %~ UT1-CAPITOLE %~ LAAS-MPN %~ LAAS-I2C %~ LAAS-MICRO-NANO-BIO-TECHNOLOGIES %~ DRT %~ LETI %~ INSA-GROUPE %~ CEA-GRE %~ TOULOUSE-INP %~ UNIV-UT3 %~ UT3-INP %~ UT3-TOULOUSEINP