A new Voltage Measurement Probe for investigating Radiated Immunity Test - LAAS - Laboratoire d'Analyse et d'Architecture des Systèmes
Communication Dans Un Congrès Année : 2020

A new Voltage Measurement Probe for investigating Radiated Immunity Test

Résumé

Diagnosis of failures induced during radiated immunity tests in anechoic chamber and validation of field-to-line coupling models require measurements of the induced voltages at the input of electronic equipments. Although such measurements seem obvious at first sight, they can become complicated and erroneous due to measurement conditions. This paper describes the design a miniature high-frequency voltage probe to solve this issue. This probe is validated experimentally by a comparison with simulation.
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Dates et versions

hal-02951842 , version 1 (29-09-2020)

Identifiants

  • HAL Id : hal-02951842 , version 1

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Alexandre Boyer, Sonia Ben Dhia, André Durier. A new Voltage Measurement Probe for investigating Radiated Immunity Test. EMC Europe 2020, Sep 2020, Rome (virtual), Italy. ⟨hal-02951842⟩
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