@article{lara:hal-03466580, TITLE = {{Impact of place and route strategy on FPGA electromagnetic emission}}, AUTHOR = {Lara, Estevan L and Constante, Allan A and Benfica, Juliano and Vargas, Fabian and Boyer, Alexandre and Ben Dhia, Sonia and Gleinser, Andreas and Winkler, Gunter and Deutschmann, Bernd}, URL = {https://laas.hal.science/hal-03466580}, JOURNAL = {{Microelectronics Reliability}}, HAL_LOCAL_REFERENCE = {Rapport LAAS n{\textdegree} 21513}, PUBLISHER = {{Elsevier}}, VOLUME = {126}, PAGES = {114333}, YEAR = {2021}, MONTH = Nov, DOI = {10.1016/j.microrel.2021.114333}, KEYWORDS = {Commercial Field-Programmable Gate Array (FPGA) ; Logic place and route process ; Electromagnetic emission (EME) ; GTEM Cell Test Method ; Surface Scan Test Method}, PDF = {https://laas.hal.science/hal-03466580/file/ESREF2021-Vargas-%28Paper41%29f.pdf}, HAL_ID = {hal-03466580}, HAL_VERSION = {v1}, }