On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II
Résumé
The work presented in this two-part paper focuses on a prediction method of the radiated susceptibility of integrated circuit and printed circuit board from near-field scan injection, in order to anticipate risks of non-compliance due to design weakness. In Part I, a worst-case estimator of the far-field induced voltage on a PCB trace was proposed. Based on it, an estimator of the radiated susceptibility of a printed-circuit board based on near-field scan results is derived and validated through two validation case studies.
Domaines
Electronique| Origine | Fichiers produits par l'(les) auteur(s) |
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