Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance - LAAS - Laboratoire d'Analyse et d'Architecture des Systèmes
Communication Dans Un Congrès Année : 2024

Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance

Alexandre Boyer

Résumé

This paper deals with the susceptibility of operational amplifiers (op-amps) in multifrequency injection. After an in-depth analysis of the different failure mechanisms that induces DC-offset based on experimental results on a general-purpose op-amp, the paper proposes a risk assessment method based on continuous wave susceptibility test results.

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Dates et versions

hal-04734444 , version 1 (14-10-2024)

Identifiants

  • HAL Id : hal-04734444 , version 1

Citer

Alexandre Boyer, Fabrice Caignet. Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance. 1'th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, Oct 2024, Turin (IT), Italy. ⟨hal-04734444⟩
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