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authFullName_s : Arnaud Dufour
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Drift effects and trap analysis of power-GaN-HEMT under switching power cycling

Manuel A González-Sentís , Patrick Tounsi , Alain Bensoussan , Arnaud Dufour
Science of Electronics, Technologies of Information and Telecommunication, SETIT’18, Dec 2018, Hammamet, Tunisia
Conference papers hal-02131990v1