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authFullName_s : François Marc

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis

Nathalie Labat , François Marc , Helene Frémont , Marise Bafleur
Microelectronics Reliability, 2017, 76-77, pp.1 - 5. ⟨10.1016/j.microrel.2017.08.002⟩
Journal articles hal-01660958v1

Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

Nathalie Labat , François Marc , Hélène Frémont , Nicolas Nolhier
32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. Microelectronics Reliability, pp.114403, 2021, ⟨10.1016/j.microrel.2021.114403⟩
Special issue hal-03408633v1
Image document

Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors

Lucas Réveil , Mukherjee Chhandak , Cristell Maneux , Marina Deng , François Marc , et al.
30th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC 2022), Oct 2022, Patras, Greece. 2 p., ⟨10.1109/VLSI-SoC54400.2022.9939576⟩
Conference papers hal-03765079v1

Microelectronics Reliability Volume 55, Issues 9–10

Philippe Perdu , François Marc , Marise Bafleur , Hélène Fremont , Nicolas Nolhier
Volume 55, ( Issues 9–10), 2015, Microelectronics Reliability
Books hal-01257945v1

Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015

Marise Bafleur , Philippe Perdu , François Marc , Hélène Frémont , Nicolas Nolhier
Microelectronics Reliability, 2015, 55 (9-10), pp.1269-1270. ⟨10.1016/j.microrel.2015.09.028⟩
Journal articles hal-01257965v1
Image document

3D logic cells design and results based on Vertical NWFET technology including tied compact model

Mukherjee Chhandak , Marina Deng , François Marc , Cristell Maneux , Arnaud Poittevin , et al.
28th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC) 2020, Oct 2020, Salt Lake City (virtual), United States. ⟨10.1109/VLSI-SOC46417.2020.9344094⟩
Conference papers hal-03166674v1

Proceedings of the 30th European Symposium on the reliability of electron devices, failure physics and analysis

Nicolas Nolhier , Nathalie Labat , Hélène Frémont , François Marc , Fabrice Caignet , et al.
ESREF 2019, Sep 2019, Microelectronics Reliability, 100-101, pp.113498, 2019, ⟨10.1016/j.microrel.2019.113498⟩
Special issue hal-02884107v1

3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model

Arnaud Poittevin , Chhandak Mukherjee , Ian O'Connor , Cristell Maneux , Guilhem Larrieu , et al.
VLSI-SoC: Design Trends, 621, Springer International Publishing, pp.301-321, 2021, IFIP Advances in Information and Communication Technology, ⟨10.1007/978-3-030-81641-4_14⟩
Book section hal-03371673v1