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Structural and Electrical Characterizations of BiSb Topological Insulator Layers Epitaxially Integrated on GaAs
Dima Sadek
,
Richard Daubriac
,
Corentin Durand
,
Richard Monflier
,
Quentin Gravelier
,
et al.
Journal articles
hal-03775836v1
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Failure Mode Analysis in Microsecond UV Laser Annealing of Cu Thin Films
Rémi Demoulin
,
Richard Daubriac
,
Louis Thuries
,
Emmanuel Scheid
,
Fabien Rozé
,
et al.
Conference papers
hal-03795894v1
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High performance CMOS FDSOI devices activated at low temperature
L. Pasini
,
P. Batude
,
J. Lacord
,
M. Cassé
,
B. Mathieu
,
et al.
Conference papers
hal-01730659v1
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Stress relaxation and dopant activation in nsec laser annealed SiGe
Fuccio Cristiano
,
Richard Monflier
,
Richard Daubriac
,
Rémi Demoulin
,
Emmanuel Scheid
,
et al.
Conference papers
hal-03449341v1
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Differential hall characterization of shallow strained SiGe layers
Richard Daubriac
,
Mahmoud Abou Daher
,
Emmanuel Scheid
,
Fuccio Cristiano
,
S. Joblot
,
et al.
Conference papers
hal-01730652v1
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A Differential Hall Effect method with sub-nanometre resolution for active dopant concentration profiling in ultra-thin Si 1-x Ge x and Si doped layers
Richard Daubriac
,
Emmanuel Scheid
,
S. Joblot
,
R. Beneyton
,
P Acosta Alba
,
et al.
2018
Preprints, Working Papers, ...
hal-01730674v1
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Dopant Activation in Ultra-thin SiGeOI and SOI layers characterised by Differential Hall Effect
Richard Daubriac
,
Emmanuel Scheid
,
S. Joblot
,
R. Beneyton
,
P Acosta Alba
,
et al.
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, Mar 2018, Grenade, Spain
Conference papers
hal-01735436v1
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A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si 1− x Ge x and Si layers
Richard Daubriac
,
Emmanuel Scheid
,
Hiba Rizk
,
Richard Monflier
,
Sylvain Joblot
,
et al.
Journal articles
hal-01921179v1
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Caractérisation de techniques d'implantations ioniques alternatives pour l'optimisation du module source-drain de la technologie FDSOI 28nm
Richard Daubriac
Theses
tel-02087031v2
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