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authFullName_s : Sébastien Serpaud

Comparison of extraction methods to build a radiated emission model of ICs (ICEM-RE): pros and cons

Sébastien Serpaud , Chaimae Ghfiri , Alexandre Boyer , André Durier
EMC Europe 2017 , Sep 2017, Angers, France. 23p
Conference papers hal-01598948v1
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In-Situ and Contactless Evaluation of Performance of Power Converter EMC Filter based on Near-Field Scan Measurement

Alexandre Boyer , Sonia Ben Dhia , Sébastien Serpaud
EMC Europe 2023, Sep 2023, Cracovie (PL), Poland
Conference papers hal-04227850v1
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change

Saliha Chetouani , Alexandre Boyer , Sonia Ben Dhia , Sébastien Serpaud , André Durier
13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩
Conference papers hal-03654075v1
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Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Saliha Chetouani , Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
EMC Europe 2020, Sep 2020, Rome (online), Italy
Conference papers hal-02951845v1
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Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multi-Frequency Near-Field Scanning Measurement

Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia , Fabio Coccetti
IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (3), pp.816 - 826. ⟨10.1109/TEMC.2021.3136096⟩
Journal articles hal-03543405v1

Gestion de l’obsolescence des composants pour la CEM

Alexandre Boyer , Marine Stojanovic , Kévin Loudière , Frédéric Lafon , Sébastien Serpaud
Techniques de l'Ingenieur, 2022, pp.g7034. ⟨10.51257/a-v1-g7034⟩
Journal articles hal-03833072v1
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Sequential adaptive sampling algorithm to reduce the near field measurement time

Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain
Conference papers hal-02319466v1
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Application de la méthode de mesure champ proche en émission pour l’aide à la conception et à l’investigation des non-conformités CEM des cartes électroniques

Sébastien Serpaud
Micro et nanotechnologies/Microélectronique. INSA de Toulouse, 2023. Français. ⟨NNT : 2023ISAT0001⟩
Theses tel-04048170v2
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APPLICATION DES METHODES DE MESURES INDIRECTES DE PARAMETRES " S " EN VUE DE LA GESTION DE L'OBSOLESCENCE DES COMPOSANTS EN IMMUNITE CONDUITE

Saliha Chetouani , Alexandre Boyer , Sébastien Serpaud , Sonia Ben Dhia
20e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2021, Apr 2021, Lyon (virtuel), France
Conference papers hal-03201537v1
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Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement

Alexandre Boyer , Sébastien Serpaud , Sonia Ben Dhia , Fabio Coccetti
EMC Europe 2023, Sep 2023, Cracovie, Poland
Conference papers hal-04227864v1
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Proposal for combined conducted and radiated emission modelling for Integrated Circuit

Sébastien Serpaud , Chaimae Ghfiri , Alexandre Boyer , A Durier
11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.172-177, ⟨10.1109/EMCCompo.2017.7998105⟩
Conference papers hal-01574387v2
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Fast and Accurate Near-Field Measurement Method using Sequential Spatial Adaptive Sampling (SSAS) Algorithm

Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia , Fabio Coccetti
IEEE Transactions on Electromagnetic Compatibility, 2021, 63 (3), pp.858-869. ⟨10.1109/TEMC.2020.3025547⟩
Journal articles hal-02967998v1