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authIdHal_s : alexandre-boyer
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Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends

Alexandre Boyer , Sonia Ben Dhia
Minapad Forum 2015, Apr 2015, Grenoble, France. 6p
Conference papers hal-01159227v1
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Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors

Jian-Fei Wu , Etienne Sicard , Alexandre Boyer , Sonia Ben Dhia , Jiancheng Li , et al.
Electronics Letters, 2012, 48 (11), pp.649-650. ⟨10.1049/el.2012.0407⟩
Journal articles hal-00709287v1
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Effect of Electrical Stresses on the Susceptibility of a Voltage regulator

Jian-Fei Wu , Jiancheng Li , Rongjun Shen , Alexandre Boyer , Sonia Ben Dhia
EMC Symposium in Europe 2013 (EMC Europe 2013), Sep 2013, Bruges, Belgium. pp.113
Conference papers hal-01006119v1
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Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits

Alexandre Boyer , Sonia Ben Dhia , Binhong Li , Nestor Berbel , Raul Fernandez-Garcia
IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (1), pp. 44-50. ⟨10.1109/TEMC.2013.2272195⟩
Journal articles hal-00937775v1
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Modeling Magnetic Near-Field Injection at Silicon Die Level

Alexandre Boyer , Bertrand Vrignon , Manuel Cavarroc
IEEE Transactions on Electromagnetic Compatibility, 2015, 58 (1), pp. 257-269. ⟨10.1109/TEMC.2015.2486041⟩
Journal articles hal-01225324v1
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Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions

Abhishek Ramanujan , Etienne Sicard , Alexandre Boyer , Jean-Luc Levant , Christian Marot , et al.
10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Nov 2015, Edimburgh, United Kingdom. 6p
Conference papers hal-01225367v1
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An alternative approach to model the Internal Activity of integrated circuits

Nestor Berbel , Raul Fernandez-Garcia , Ignacio Gil , Binhong Li , Sonia Ben Dhia , et al.
8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.88
Conference papers hal-00669719v1
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Enhancing Engineers Skills in EMC of Integrated Circuits

Etienne Sicard , Alexandre Boyer
8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.115
Conference papers hal-00669721v1
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Ageing effect on electromagnetic susceptibility of a phase locked loop

Binhong Li , Alexandre Boyer , Sonia Ben Dhia , Christophe Lemoine
Microelectronics Reliability, 2010, 50 (9), p.1304-1308. ⟨10.1016/j.microrel.2010.07.100⟩
Journal articles hal-00669515v1
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An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences

Alexandre Boyer , Sonia Ben Dhia , Christophe Lemoine , Bertrand Vrignon
8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251
Conference papers hal-00669533v1
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On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations

Sonia Ben Dhia , Alexandre Boyer , Bertrand Vrignon , Mikael Deobarro , Dinh Than Vinh
IEEE Transactions on Instrumentation and Measurement, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩
Journal articles hal-00668627v1
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change

Saliha Chetouani , Alexandre Boyer , Sonia Ben Dhia , Sébastien Serpaud , André Durier
13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩
Conference papers hal-03654075v1
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Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Saliha Chetouani , Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
EMC Europe 2020, Sep 2020, Rome (online), Italy
Conference papers hal-02951845v1

The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future

Mohamed Ramdani , Etienne Sicard , Alexandre Boyer , Sonia Ben Dhia , James Whalen , et al.
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
Journal articles hal-02523680v1
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Impact of Technological Trends and Electromagnetic Compatibility of Integrated Circuits

Etienne Sicard , Alexandre Boyer
EMC Compo 2019, Oct 2019, Haining, China
Conference papers hal-02403882v1
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MÉTHODE D'EXTRACTION RAPIDE ET EFFICACE D'UN MODÈLE DE PROTECTION ESD FACE À DES PHÉNOMÈNES TRANSITOIRES RAPIDES

François Ruffat , Fabrice Caignet , Alexandre Boyer , Guillaume Mejecaze , Fabien Escudie , et al.
21ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM 2023), Jun 2023, Toulouse, France
Conference papers hal-04203263v1
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A new Voltage Measurement Probe for investigating Radiated Immunity Test

Alexandre Boyer , Sonia Ben Dhia , André Durier
EMC Europe 2020, Sep 2020, Rome (virtual), Italy
Conference papers hal-02951842v1
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Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission

Alexandre Boyer , Sonia Ben Dhia
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, ⟨10.1109/EMCCompo.2013.6735199⟩
Conference papers hal-00945301v1
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New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs

Nabil El Belghiti Alaoui , Patrick Tounsi , Alexandre Boyer , Arnaud Viard
29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩
Conference papers hal-02319457v1
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A Review of Research on the Effect of Aging on the EMC of Integrated Circuits

Sonia Ben Dhia , Alexandre Boyer
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016), May 2016, Shenzhen, China. ⟨10.1109/APEMC.2016.7522971⟩
Conference papers hal-01403874v1
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Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer , He Huang , Sonia Ben Dhia
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩
Conference papers hal-01403875v1
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AMELIORATION DE LA RESOLUTION SPATIALE DE SCAN CHAMP PROCHE EN INJECTION

Alexandre Boyer
18e Colloque International et Exposition sur la Compatibilité Electromagnétique CEM2016, Jul 2016, Rennes, France
Conference papers hal-01403886v1
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Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose

Chaimae Ghfiri , Alexandre Boyer , Andre Durier , Sonia Ben Dhia
Congrès de l'école doctorale GEET, Mar 2017, Toulouse, France. 6p
Conference papers hal-01500303v1
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Modeling methodology of the conducted emission of a DC-DC converter board

Alexandre Boyer , Manuel Antero Gonzalez Sentis , Chaimae Ghfiri , André A Durier
11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.73-78, ⟨10.1109/EMCCompo.2017.7998085⟩
Conference papers hal-01574376v1

Comparison of extraction methods to build a radiated emission model of ICs (ICEM-RE): pros and cons

Sébastien Serpaud , Chaimae Ghfiri , Alexandre Boyer , André Durier
EMC Europe 2017 , Sep 2017, Angers, France. 23p
Conference papers hal-01598948v1
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Study of the thermal aging effect on the conducted emission of a synchronous buck converter

Alexandre Boyer , Manuel Antero Gonzalez Sentis , Chaimae Ghfiri , André Durier
EMC Compo (The 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits), Jul 2017, Saint Petersburg, Russia. pp. 79-84
Conference papers hal-01649708v1
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A Low-Cost RF Detector to Enhance the Direct Power Injection Conducted Immunity Setup

Alexandre Boyer
IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2022, 4 (4), pp.108 - 113. ⟨10.1109/LEMCPA.2022.3210876⟩
Journal articles hal-03794115v1
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Near-Field Injection At Die Level

Alexandre Boyer , B Vrignon , Manuel Cavarroc , J Shepherd
Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan
Conference papers hal-01159220v1
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Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier

He Huang , Alexandre Boyer , Sonia Ben Dhia , Bertrand Vrignon
Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p
Conference papers hal-01159222v1
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Reliability of active RFID tag immersed in water for anti-kidnapping applications

Clément Crémoux , Alexandre Boyer , Karim Ben Dhia
2014 IEEE-APS Topical Conference on Antennas and Propagation in Wireless Communications (APWC), Aug 2014, Aruba, Aruba. pp.40-43
Conference papers hal-01068122v1