Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends
Alexandre Boyer
,
Sonia Ben Dhia
Minapad Forum 2015 , Apr 2015, Grenoble, France. 6p
Conference papers
hal-01159227v1
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Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors
Jian-Fei Wu
,
Etienne Sicard
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Jiancheng Li
,
et al.
Journal articles
hal-00709287v1
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Effect of Electrical Stresses on the Susceptibility of a Voltage regulator
Jian-Fei Wu
,
Jiancheng Li
,
Rongjun Shen
,
Alexandre Boyer
,
Sonia Ben Dhia
EMC Symposium in Europe 2013 (EMC Europe 2013) , Sep 2013, Bruges, Belgium. pp.113
Conference papers
hal-01006119v1
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Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits
Alexandre Boyer
,
Sonia Ben Dhia
,
Binhong Li
,
Nestor Berbel
,
Raul Fernandez-Garcia
Journal articles
hal-00937775v1
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An alternative approach to model the Internal Activity of integrated circuits
Nestor Berbel
,
Raul Fernandez-Garcia
,
Ignacio Gil
,
Binhong Li
,
Sonia Ben Dhia
,
et al.
8th Workshop on Electromagnetic Compatibility of Integrated Circuits , Nov 2011, Dubrovnik, Croatia. pp.88
Conference papers
hal-00669719v1
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Ageing effect on electromagnetic susceptibility of a phase locked loop
Binhong Li
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Christophe Lemoine
Journal articles
hal-00669515v1
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An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences
Alexandre Boyer
,
Sonia Ben Dhia
,
Christophe Lemoine
,
Bertrand Vrignon
8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) , Nov 2011, Dubrovnik, Croatia. pp.251
Conference papers
hal-00669533v1
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On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations
Sonia Ben Dhia
,
Alexandre Boyer
,
Bertrand Vrignon
,
Mikael Deobarro
,
Dinh Than Vinh
Journal articles
hal-00668627v1
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change
Saliha Chetouani
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Sébastien Serpaud
,
André Durier
Conference papers
hal-03654075v1
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Fast and efficient approach to predict EMC immunity of complex equipment after a component change
Saliha Chetouani
,
Sébastien Serpaud
,
Alexandre Boyer
,
Sonia Ben Dhia
EMC Europe 2020 , Sep 2020, Rome (online), Italy
Conference papers
hal-02951845v1
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The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future
Mohamed Ramdani
,
Etienne Sicard
,
Alexandre Boyer
,
Sonia Ben Dhia
,
James Whalen
,
et al.
Journal articles
hal-02523680v1
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Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field
L. Bouhouch
,
A. Boyer
,
Sonia Ben Dhia
,
Etienne Sicard
,
M. Fadel
Journal articles
hal-02523683v1
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A new Voltage Measurement Probe for investigating Radiated Immunity Test
Alexandre Boyer
,
Sonia Ben Dhia
,
André Durier
EMC Europe 2020 , Sep 2020, Rome (virtual), Italy
Conference papers
hal-02951842v1
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Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission
Alexandre Boyer
,
Sonia Ben Dhia
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013) , Dec 2013, Nara, Japan. pp.190-195,
⟨10.1109/EMCCompo.2013.6735199⟩
Conference papers
hal-00945301v1
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Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method
André Durier
,
Sonia Ben Dhia
,
Tristan Dubois
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) , Oct 2019, Hangzhou, China. pp.52-54,
⟨10.1109/EMCCompo.2019.8919720⟩
Conference papers
hal-02523743v1
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On the measurement of crosstalk in integrated circuits
Sonia Ben Dhia
,
Fabrice Caignet
,
E. Sicard
IEEE Transactions on Very Large Scale Integration (VLSI) Systems , 2000, 8 (5), pp.606-609.
⟨10.1109/92.894165⟩
Journal articles
hal-02523709v1
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On-chip sampling in CMOS integrated circuits
Sonia Ben Dhia
,
S. Delmas-Bendhia
,
Fabrice Caignet
,
E. Sicard
,
M. Roca
IEEE Transactions on Electromagnetic Compatibility , 1999, 41 (4), pp.403-406.
⟨10.1109/15.809837⟩
Journal articles
hal-02523721v1
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A Review of Research on the Effect of Aging on the EMC of Integrated Circuits
Sonia Ben Dhia
,
Alexandre Boyer
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016) , May 2016, Shenzhen, China.
⟨10.1109/APEMC.2016.7522971⟩
Conference papers
hal-01403874v1
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Predicting the risk of non-compliance to EMC requirements during the life-cycle
Alexandre Boyer
,
He Huang
,
Sonia Ben Dhia
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016) , May 2016, Shenzhen, China. pp.452 - 455,
⟨10.1109/APEMC.2016.7522766⟩
Conference papers
hal-01403875v1
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Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose
Chaimae Ghfiri
,
Alexandre Boyer
,
Andre Durier
,
Sonia Ben Dhia
Congrès de l'école doctorale GEET , Mar 2017, Toulouse, France. 6p
Conference papers
hal-01500303v1
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Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
,
Bertrand Vrignon
Asia-Pacific International EMC Symposium 2015 , May 2015, Taipei, Taiwan. 4p
Conference papers
hal-01159222v1
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The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint
He Huang
,
Alexandre Boyer
,
Sonia Ben Dhia
EMC Europe 2014 , Sep 2014, Gothenburg, Sweden. pp.1-5
Conference papers
hal-01068129v1
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IC immunity modeling process validation using on-chip measurements
Sonia Ben Dhia
,
Alexandre Boyer
,
Bertrand Vrignon
,
Mikael Deobarro
Journal articles
hal-00936080v1
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Impact of thermal aging on emission of a buck DC-DC converter
Alexandre Boyer
,
He Huang
,
Sonia Ben Dhia
2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo) , May 2014, Tokyo, Japan. pp.77-80
Conference papers
hal-01006115v1
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Effect of Electrical Stresses on Digital Integrated Circuits Power Integrity
Alexandre Boyer
,
Sonia Ben Dhia
2013 17th IEEE Workshop on Signal and Power Integrity (SPI) , May 2013, Paris, France. pp.1-4
Conference papers
hal-01006121v1
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Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model
Cécile Labussière-Dorgan
,
Sonia Ben Dhia
,
Etienne Sicard
,
Junwu Tao
,
Henrique Jorge Quaresma
,
et al.
Journal articles
hal-02523684v1
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Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan
A. Boyer
,
Sonia Ben Dhia
,
Etienne Sicard
Journal articles
hal-02523686v1
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The challenge of signal integrity in deep-submicrometer CMOS technology
Fabrice Caignet
,
Sonia Ben Dhia
,
Etienne Sicard
Journal articles
hal-02523701v1
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A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits
Chaimae Ghfiri
,
Alexandre Boyer
,
André Durier
,
Sonia Ben Dhia
Journal articles
hal-01659770v1
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Characterization of Changes in LDO Susceptibility after Electrical Stress
Jianfei Wu
,
Alexandre Boyer
,
Jiancheng Li
,
Sonia Ben Dhia
,
Rongjun Shen
Journal articles
hal-00937780v1
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