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authIdHal_s : sonia-ben-dhia
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Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends

Alexandre Boyer , Sonia Ben Dhia
Minapad Forum 2015, Apr 2015, Grenoble, France. 6p
Conference papers hal-01159227v1
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Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors

Jian-Fei Wu , Etienne Sicard , Alexandre Boyer , Sonia Ben Dhia , Jiancheng Li , et al.
Electronics Letters, 2012, 48 (11), pp.649-650. ⟨10.1049/el.2012.0407⟩
Journal articles hal-00709287v1
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Effect of Electrical Stresses on the Susceptibility of a Voltage regulator

Jian-Fei Wu , Jiancheng Li , Rongjun Shen , Alexandre Boyer , Sonia Ben Dhia
EMC Symposium in Europe 2013 (EMC Europe 2013), Sep 2013, Bruges, Belgium. pp.113
Conference papers hal-01006119v1
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Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits

Alexandre Boyer , Sonia Ben Dhia , Binhong Li , Nestor Berbel , Raul Fernandez-Garcia
IEEE Transactions on Electromagnetic Compatibility, 2014, 56 (1), pp. 44-50. ⟨10.1109/TEMC.2013.2272195⟩
Journal articles hal-00937775v1
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An alternative approach to model the Internal Activity of integrated circuits

Nestor Berbel , Raul Fernandez-Garcia , Ignacio Gil , Binhong Li , Sonia Ben Dhia , et al.
8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Nov 2011, Dubrovnik, Croatia. pp.88
Conference papers hal-00669719v1
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Ageing effect on electromagnetic susceptibility of a phase locked loop

Binhong Li , Alexandre Boyer , Sonia Ben Dhia , Christophe Lemoine
Microelectronics Reliability, 2010, 50 (9), p.1304-1308. ⟨10.1016/j.microrel.2010.07.100⟩
Journal articles hal-00669515v1
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An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences

Alexandre Boyer , Sonia Ben Dhia , Christophe Lemoine , Bertrand Vrignon
8th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Nov 2011, Dubrovnik, Croatia. pp.251
Conference papers hal-00669533v1
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On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations

Sonia Ben Dhia , Alexandre Boyer , Bertrand Vrignon , Mikael Deobarro , Dinh Than Vinh
IEEE Transactions on Instrumentation and Measurement, 2012, 61 (3), pp.696. ⟨10.1109/TIM.2011.2172116⟩
Journal articles hal-00668627v1
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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change

Saliha Chetouani , Alexandre Boyer , Sonia Ben Dhia , Sébastien Serpaud , André Durier
13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩
Conference papers hal-03654075v1
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Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Saliha Chetouani , Sébastien Serpaud , Alexandre Boyer , Sonia Ben Dhia
EMC Europe 2020, Sep 2020, Rome (online), Italy
Conference papers hal-02951845v1

The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future

Mohamed Ramdani , Etienne Sicard , Alexandre Boyer , Sonia Ben Dhia , James Whalen , et al.
IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩
Journal articles hal-02523680v1

Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field

L. Bouhouch , A. Boyer , Sonia Ben Dhia , Etienne Sicard , M. Fadel
Ferroelectrics, 2008, 371 (1), pp.133-138. ⟨10.1080/00150190802397791⟩
Journal articles hal-02523683v1
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A new Voltage Measurement Probe for investigating Radiated Immunity Test

Alexandre Boyer , Sonia Ben Dhia , André Durier
EMC Europe 2020, Sep 2020, Rome (virtual), Italy
Conference papers hal-02951842v1
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Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission

Alexandre Boyer , Sonia Ben Dhia
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, ⟨10.1109/EMCCompo.2013.6735199⟩
Conference papers hal-00945301v1

Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method

André Durier , Sonia Ben Dhia , Tristan Dubois
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Oct 2019, Hangzhou, China. pp.52-54, ⟨10.1109/EMCCompo.2019.8919720⟩
Conference papers hal-02523743v1

On the measurement of crosstalk in integrated circuits

Sonia Ben Dhia , Fabrice Caignet , E. Sicard
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2000, 8 (5), pp.606-609. ⟨10.1109/92.894165⟩
Journal articles hal-02523709v1

On-chip sampling in CMOS integrated circuits

Sonia Ben Dhia , S. Delmas-Bendhia , Fabrice Caignet , E. Sicard , M. Roca
IEEE Transactions on Electromagnetic Compatibility, 1999, 41 (4), pp.403-406. ⟨10.1109/15.809837⟩
Journal articles hal-02523721v1
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A Review of Research on the Effect of Aging on the EMC of Integrated Circuits

Sonia Ben Dhia , Alexandre Boyer
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC 2016), May 2016, Shenzhen, China. ⟨10.1109/APEMC.2016.7522971⟩
Conference papers hal-01403874v1
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Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer , He Huang , Sonia Ben Dhia
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩
Conference papers hal-01403875v1
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Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose

Chaimae Ghfiri , Alexandre Boyer , Andre Durier , Sonia Ben Dhia
Congrès de l'école doctorale GEET, Mar 2017, Toulouse, France. 6p
Conference papers hal-01500303v1
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Prediction of Aging Impact on Electromagnetic Susceptibility of an Operational Amplifier

He Huang , Alexandre Boyer , Sonia Ben Dhia , Bertrand Vrignon
Asia-Pacific International EMC Symposium 2015, May 2015, Taipei, Taiwan. 4p
Conference papers hal-01159222v1
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The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint

He Huang , Alexandre Boyer , Sonia Ben Dhia
EMC Europe 2014, Sep 2014, Gothenburg, Sweden. pp.1-5
Conference papers hal-01068129v1
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IC immunity modeling process validation using on-chip measurements

Sonia Ben Dhia , Alexandre Boyer , Bertrand Vrignon , Mikael Deobarro
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.339-348. ⟨10.1007/s10836-012-5294-3⟩
Journal articles hal-00936080v1
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Impact of thermal aging on emission of a buck DC-DC converter

Alexandre Boyer , He Huang , Sonia Ben Dhia
2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), May 2014, Tokyo, Japan. pp.77-80
Conference papers hal-01006115v1
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Effect of Electrical Stresses on Digital Integrated Circuits Power Integrity

Alexandre Boyer , Sonia Ben Dhia
2013 17th IEEE Workshop on Signal and Power Integrity (SPI), May 2013, Paris, France. pp.1-4
Conference papers hal-01006121v1

Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

Cécile Labussière-Dorgan , Sonia Ben Dhia , Etienne Sicard , Junwu Tao , Henrique Jorge Quaresma , et al.
IEEE Transactions on Electromagnetic Compatibility, 2008, 50 (1), pp.22-34. ⟨10.1109/TEMC.2007.911918⟩
Journal articles hal-02523684v1

Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

A. Boyer , Sonia Ben Dhia , Etienne Sicard
Electronics Letters, 2007, 43 (1), pp.15. ⟨10.1049/el:20073130⟩
Journal articles hal-02523686v1

The challenge of signal integrity in deep-submicrometer CMOS technology

Fabrice Caignet , Sonia Ben Dhia , Etienne Sicard
Proceedings of the IEEE, 2001, 89 (4), pp.556-573. ⟨10.1109/5.920583⟩
Journal articles hal-02523701v1
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A new methodology to build the Internal Activity Block of ICEM-CE for complex Integrated Circuits

Chaimae Ghfiri , Alexandre Boyer , André Durier , Sonia Ben Dhia
IEEE Transactions on Electromagnetic Compatibility, 2018, 60 (5), pp.1500-1509. ⟨10.1109/TEMC.2017.2767084⟩
Journal articles hal-01659770v1
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Characterization of Changes in LDO Susceptibility after Electrical Stress

Jianfei Wu , Alexandre Boyer , Jiancheng Li , Sonia Ben Dhia , Rongjun Shen
IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (5), pp.883-890. ⟨10.1109/TEMC.2013.2242471⟩
Journal articles hal-00937780v1