Search - LAAS - Laboratoire d'Analyse et d'Architecture des Systèmes Access content directly

Filter your results

4 Results
Structure: Internal structure identifier : 206200

Locally Ion Implantation and Annealing Effects in Diamond

Karine Isoird , Josiane Tasselli , Yohann Spiegel , Raid. Gourad , Fuccio Cristiano , et al.
E-MRS 2022 Fall Meeting., Sep 2022, Warsaw, Poland
Conference papers hal-03766749v1
Image document

Première démonstration expérimentale d’un interrupteur HEMT normally-off en GaN avec une région P-GaN enterrée

Audrey Chapelle , Éric Frayssinet , Yvon Cordier , Yohann Spiegel , Leïla Benmosfeta , et al.
Symposium de Génie Electrique (SGE 2018), Université de Lorraine [UL], Jul 2018, Nancy, France. pp.3 - 5
Conference papers hal-02981903v2

Implantation-induced structural defects in highly activated USJs: Boron precipitation and trapping in pre-Amorphised silicon

Fuccio Cristiano , Zahi Essa , Yang Qiul , Yohann Spiegel , Frank Torregrosa , et al.
12th International Workshop on Junction Technology (IWJT 2012), May 2012, Shanghai, China. pp.1--7, ⟨10.1109/IWJT.2012.6212827⟩
Conference papers hal-01928869v1
Image document

Advantages and challenges of Plasma Immersion Ion Implantation for Power devices manufacturing on Si, SiC and GaN using PULSION ® tool

Frank Torregrosa , Guillaume Sempere , Werner Schustereder , Philippe Godignon , Yohann Spiegel , et al.
22nd International Conference on Ion Implantation Technology (IIT), Sep 2018, Würzburg, Germany. 5p., ⟨10.1109/IIT.2018.8807978⟩
Conference papers hal-01955688v1