Prediction of LIN communication robustness against EFT events using dedicated failure models - LAAS - Laboratoire d'Analyse et d'Architecture des Systèmes Access content directly
Journal Articles Microelectronics Reliability Year : 2017

Prediction of LIN communication robustness against EFT events using dedicated failure models

Abstract

During its life, an automotive application can encounter several perturbations such as fast transient of ESD discharges. In this paper, we propose a LIN transceiver behavior model to predict both hard and soft failures within a communication link. The proposed model, extracted from measurements, is implemented into simulation as a failure block. We will show that depending on the output state of the LIN, the data reading behavior could be different. Using such model, corrections at system level can be implemented to avoid failures.

Domains

Electronics
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Dates and versions

hal-01698397 , version 1 (16-02-2018)

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Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 2017, 76-77, pp.685 - 691. ⟨10.1016/j.microrel.2017.07.032⟩. ⟨hal-01698397⟩
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