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Conference Papers Year : 2019

A Rigorous Method to extrapolate Radiated Susceptibility from Near-Field Scan Immunity

Alexandre Boyer

Abstract

Near-field injection or near-field scan immunity is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances to a given near-field source. However, the extrapolation of the immunity to another radiating source, either in near or far-field, is not trivial. This paper aims at proposing a rigorous post-processing method of near-field scan immunity results to extrapolate radiated immunity in other disturbance conditions, e.g. far-field illumination. The method is described and validated through simulation case studies.
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Dates and versions

hal-02319463 , version 1 (18-10-2019)

Identifiers

  • HAL Id : hal-02319463 , version 1

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Alexandre Boyer. A Rigorous Method to extrapolate Radiated Susceptibility from Near-Field Scan Immunity. International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain. ⟨hal-02319463⟩
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