Measurement and Deembedding Technique for the on-wafer Characterization of Multiport Devices
Résumé
A useful technique is presented for on-wafer characterization of n-port devices, when measurement accesses are of unequal length and when a m-port vector network analyzer is used with m
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https://laas.hal.science/hal-02921429
Soumis le : mardi 25 août 2020-10:55:53
Dernière modification le : lundi 20 novembre 2023-11:44:22
Dates et versions
Identifiants
- HAL Id : hal-02921429 , version 1
- DOI : 10.1109/SIRF46766.2020.9040178
Citer
Audrey Cayron, Christophe Viallon, Ayad Ghannam, Alessandro Magnani, Thierry Parra. Measurement and Deembedding Technique for the on-wafer Characterization of Multiport Devices. 2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), Jan 2020, San Antonio (TX), United States. pp.53-56, ⟨10.1109/SIRF46766.2020.9040178⟩. ⟨hal-02921429⟩
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