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Communication Dans Un Congrès Année : 2024

Using Near-Field Scan to Predict the Conducted Immunity of Electronic Components up to 6 GHz

Alexandre Boyer
Fabien Escudié
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Résumé

In the context of the growing threat of radio frequency directed energy weapons (RF DEW), near-field scan immunity (NFSI) stands as a powerful method for analysing the electromagnetic (EM) susceptibility of components, allowing the study of the response of an electronic device subject to an intentional electromagnetic interference (IEMI). This non-intrusive technique precisely targets component pins that are otherwise inaccessible with commonly used immunity investigation methods. In this paper, the quantitative measurement of the near-field coupling on a microstrip line is discussed and compared to a conducted injection based on the direct power injection (DPI) standard. Two E-field and H-field injection probes are calibrated and an experimental validation is conducted with both linear and non-linear loads. The results underscore the importance of NFSI in investigating systems vulnerability to RF DEW.

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Dates et versions

hal-04689785 , version 1 (06-09-2024)

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  • HAL Id : hal-04689785 , version 1

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Nicolas Castagnet, Alexandre Boyer, Fabien Escudié. Using Near-Field Scan to Predict the Conducted Immunity of Electronic Components up to 6 GHz. EMC Europe 2024 Symposium, Sep 2024, Brugges, Belgium. ⟨hal-04689785⟩
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